RI Title
RI logo

4G-CASSINI

  1. Home
  2. Products
  3. Test Systems

Browse Kits

Parts List

4G (LTE, WiMAX) Devices

4G Devices (or Similar)

Cassini Modular ATE for 4G (LTE, WiMAX) Device Testing by RI
Cassini 16A Complete High Speed Automated
and Integrated Test Solution for:
  • PA Testing for Wafer, Package and Module format.
  • Full S-Parameter Coverage
  • P1dB
  • Fixed Pout
  • IM3
  • Leakage Current
  • ACPR/ACLR
  • Efficiency
  • Bit Error Rate (BER)
Recommended Tester Instrument Modules (TIMs)
Multiple TIMs can be configured per tester for maximum flexibility, like upgrading to multi-site testing!

Device Power Module TIM
  • DC source and measurement for device test
  • Low speed static digital for managing test circuit configuration
  • Pulsed 3 A current source and measure
  • All dynamic features are synchronous
  • Supports multi-site test
  • 8x 250 mA 4 quadrant supplies
  • 4x 3A single quadrant pulsed supplies
  • 16 Low Speed Digital lines
  • 8 Voltage Measure Lines

6 GHz Source with Amp Attenuator
  • 100 kHz to 6 GHz (usable to 20 GHz)
  • -120 dBM to +22 dBm
  • 1 Hz Resolution

20 Ghz Receiver
  • 100 MHz to 6 GHz (usable from 70 MHz to 20 GHz)
  • < -100 dBm to +30 dBm
  • < 1 Hz Resolution

12 GHz Test Set TIM
  • Provides a fully calibrated microwave path between the DUT board and the tester.
  • Allows extension to multiple port structures via additional fixture.
  • 4 Full Performance RF Ports with
  • Full Vector Measurement up to 12 GHz
  • Supports External Synthesizer
  • Supports External Digital Modulated Synthesizer
  • Supports External Receiver

Custom TIM
Please contact RI for information on custom TIMs.
  • Cutting edge technology integrated with ATE capabilities

    • Multiple TIMs can be configured per tester for maximum flexibility.