Graphical Test Plan Development Software Accelerates Development
Simple, reliable test hardware driven by novel system software sets the RI tester apart from the competition. Designed to make fundamental measurements, the system hardware is tailored for speed, reliability and stability. Typical time-wasters such as redundant measurement states, error correction calculations, and instrument processing delays are reduced or eliminated through sophisticated automatic test plan optimization. Complex measurements are synthesized by the system software from the fundamental measurements taken at very high speed, woven together with the data processing to create error corrected data. With little effect on system speed, the measurements are unobtrusively captured and saved by the built-in database. RI's virtual instrument design provides superior performance at lower cost and high reliability.
Graphical Test Plan Creation Tools
Test plan development plays a crucial role in the time-to-market equation. RI software provides the tools that enable engineers to quickly and easily debug tests, revise test programs, document, and analyze test data. Test plan creation is fast and intuitive with a graphical test plan editor. Just cut and paste tests as dictated by your requirements. RI systems allow your test engineers to design in a completely new and highly productive way. Operating in a multitasking graphical environment, test designers use a mouse to manipulate graphical objects (buttons) representing measurement processes, parameters and test results. Buttons are connected graphically and parameter values are set, resulting in a simplified flow chart-like picture of the test. Completed tests are stored in graphic form and are easily recalled and modified to create new tests.
Optimization Ensures Maximum Performance
RI's test plan compiler and optimizer automatically considers time requirements for system state changes, identifies duplicate measurement states, and restructures the test sequence for highest measurement speed. Execution speed is improved dramatically by compiling and optimizing the test plan instead of simply interpreting it. Rapid test plan development makes device characterization a powerful capability of the RI system. The software allows you to change frequency ranges and add measurement points with simple mouse selections. For example, adding multiple bias points to a gain vs. frequency test requires adding a single DC bias state button. The large volumes of data generated by device characterization are collected, stored and analyzed by RI's built-in database. Debugging features including break points and single stepping that help the user to quickly finish test plans.
Effortless Data Collection
Whether characterizing a part with hundreds of parameters or performing production testing with only a few parameters, capturing and storing measurement data is effortless with the integrated RI database. Test plans automatically store all system state, user and device information as standard data types in an SQL relational database. RI's Advanced Analysis Package allows you to analyze, summarize and view data, or export it to a variety of database and spread sheet formats.
Scalable User Interface
Log-on and security features of the RI software automatically tailor the user interface to fit the various requirements of the current user. System operators can easily select tests and start and stop the tester with a click of the mouse. Technicians can view real-time graphical test results to monitor fixture performance and overall lot/sublot performance. Production test engineers maintain complete control over tests and data. At RI, we recognize the unique requirements of each customer. We are prepared to work with customers to modify the interfaces to match specific production test environments. We also modify our data export formats to support existing data collection systems.
Production Proven
- Docking Prober and Handler Solutions
- Industry Standard Data Integration
- Powerful Software Development
- Enterprise-level Test Software Management
- Lower Cost Of Test
- RITS (Low Risk/No Cap)
Expertise
- Fastest RF ATE
- Bench to HVM
- RF-centric Board Design
- Characterization, Correlation and Verification
- High Speed Digital
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