| Device Power Module TIM |  |
- DC source and measurement for device test.
- Low speed static digital for managing test circuit configuration
- Pulsed 3 A current source and measure
- All dynamic features are synchronous
- Supports multi-site test
|
- 8x 250 mA 4 quadrant supplies
- 4x 3A single quadrant pulsed supplies
- 16 Low Speed Digital lines
- 8 Voltage Measure Lines
|
High Speed Digital Module | |
- 40 - 960 Pins (40-120 Pins per TIM)
- 100 MHz Clock and Data
- Synchronous Mixed Signal Performance
- Configurable for Data, CPU, Scan, Signal, Serial and Parallel
- Full Parametrics
|
| Vector Rate | |
| Data Formats (NRZ) | 100k to 100M vector per second |
| Clock Formats (ZS) | 100 MHz max |
| Vector Depth |
| Scan (std)
Scan (opt)
Capture
Pattern(std) | 128 Mbits ( shared by bank of 20 pins )
1024 Mbits ( shared by bank of 20 pins )
512 kbits
16M vectors per pin |
| Pin edge timing |
| OTA
Rise/fall time
Min pulse width
Edge resolution
Edge sets
Edges
Jitter | 750 ps
2 ns
5 ns
20 ps
2
32 per bank of 20 pins
200 ps rms |
|
Waveform Instrument TIM | |
- CW/Modulated IF signal source/measure
- Complex time domain waveform capture and analysis
- Modulation source
- Precision baseband signal source and measure
|
- 2x 16 bit, 100 MHz Arbitrary Waveform Source
- 100 MHz Low Noise Clock Source
- Dual 14 Bit, 80 Msps Digitizer
- Rise/Fall, Duty Cycle Events Counter
|
Phase Noise Measure TIM | |
- Input frequency range: 1 - 16 GHz
- Phase noise measure from 50 kHz to 2 MHz
- FM sideband measure
|
- Phase detector with built-in reference oscillator for
- VCO lock to test system
- Parametric supply/measure for tune voltage and current
- Linearity and Kv measure with 16-bit frequency counter
|
20 GHz Test Set TIM | |
- Provides a fully calibrated microwave path between the DUT board and the tester.
- Allows extension to multiple port structures via additional fixture.
|
- 4 Full Performance RF Ports with
- Full Vector Measurement up to 20 GHz
- Supports External Synthesizer
- Supports External Digital Modulated Synthesizer
- Supports External Receiver
|
5-40 GHz Test Set TIM | |
- Provides a fully calibrated microwave path between the DUT board and the tester.
- Allows extension to multiple port structures via additional fixture.
|
- 2 Full Performance RF Ports with
- Full Vector Measurement from 5 to 40 GHz
|
60 GHz Test Set TIM | |
- Source and Measure for WirelessHD
|
- 2 Full Performance RF Ports with
- Full Vector Measurement from 55 to 65 GHz
|
75-81 GHz Test Set TIM | |
- Source and Measure for Automotive Radar sensor IC's in wafer, package or module test
|
- 2 Full Performance RF Ports with
- Full Vector Measurement from 75 to 81 GHz
|
Custom TIM | |
| Please contact RI for information on custom TIMs. |
Cutting edge technology integrated with ATE capabilities |