CASSINI-PA: Cassini for testing Power Amplifier devices [Roos Instruments Automated Test Equipment for RF, Digital, Mixed-Signal, Microwave Devices]

Request Quote

Order Kits

Shopping Cart

My Account

Product Details

Application

Request a Quote >

CASSINI-PA


Part Number:	CASSINI-PA
Description:	Cassini for testing Power Amplifier devices

Cassini Modular ATE for PA Testing by RI
	A Complete High Speed Automated and Integrated Test Solution for: PA Testing for Wafer, Package and Module format. Full S-Parameter Coverage P1dB Fixed P_out IM3 Leakage Current ACPR/ACLR Efficiency

Recommended Tester Instrument Modules (TIMs) for PA testing
Multiple TIMs can be configured per tester for maximum flexibility, like upgrading to multi-site testing!

Device Power Module TIM
DC source and measurement for device test Low speed static digital for managing test circuit configuration Pulsed 3 A current source and measure All dynamic features are synchronous Supports multi-site test	8x 250 mA 4 quadrant supplies 4x 3A single quadrant pulsed supplies 16 Low Speed Digital lines 8 Voltage Measure Lines
6 GHz Source with Amp Attenuator
100 MHz to 6 GHz (usable to 20 GHz)	-120 dBM to +22 dBm 1 Hz Resolution
20 Ghz Receiver
100 MHz to 6 GHz (usable from 70 MHz to 20 GHz)	< -100 dBm to +30 dBm < 1 Hz Resolution
12 GHz Test Set TIM
Provides a fully calibrated microwave path between the DUT board and the tester. Allows extension to multiple port structures via additional fixture.	4 Full Performance RF Ports with Full Vector Measurement up to 12 GHz Supports External Synthesizer Supports External Digital Modulated Synthesizer Supports External Receiver
Custom TIM
Please contact RI for information on custom TIMs.	Cutting edge technology integrated with ATE capabilities

Multiple TIMs can be configured per tester for maximum flexibility.

Applications:
Power Amplifiers

Request a Quote >