This item will not be restocked when depleted and should be avoided for new designs.
This product entered limited availablity on 08/04/2009. View RIKs with Limited Availability for a complete list.
Expiration Reason: Improved performance and reliability
- DC source and measurement for device test.
- Low speed static digital for managing test circuit configuration
- Pulsed 3 A current source and measure
- All dynamic features are synchronous
- Supports multi-site test
- 8x 250 mA 4 quadrant supplies
- 4x 3A single quadrant pulsed supplies
- 16 Low Speed Digital lines
- 8 Voltage Measure Lines Related Documents: (user account required, Register Now)
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