| Device Power Module TIM |  |
- DC source and measurement for device test
- Low speed static digital for managing test circuit configuration
- Pulsed 3 A current source and measure
- All dynamic features are synchronous
- Supports multi-site test
|
- 8x 250 mA 4 quadrant supplies
- 4x 3A single quadrant pulsed supplies
- 16 Low Speed Digital lines
- 8 Voltage Measure Lines
|
High Speed Digital Module | |
- 20 - 1200 Pins (120 Pins per TIM)
- 100 MHz Clock and Data
- Synchronous Mixed Signal Performance
- Configurable for Data, CPU, Scan, Signal, Serial and Parallel
- Full Parametrics
|
| Vector Rate | |
| Data Formats (NRZ) | 100k to 100M vector per second |
| Clock Formats (ZS) | 100 MHz max |
| Vector Depth |
| Scan (std)
Scan (opt)
Capture
Pattern(std) | 128 Mbits ( shared by bank of 20 pins )
1024 Mbits ( shared by bank of 20 pins )
512 kbits
16M vectors per pin |
| Pin edge timing |
| OTA
Rise/fall time
Min pulse width
Edge resolution
Edge sets
Edges
Jitter | 750 ps
2 ns
5 ns
20 ps
2
32 per bank of 20 pins
200 ps rms |
|
Custom TIM | |
| Please contact RI for information on custom TIMs. |
Cutting edge technology integrated with ATE capabilities |